Graftek Imaging
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Bottle Inspection System
- New software with more intuitive user interface
- Multiple (200) measurements around the bottle
- Wide range of bottle sizes and neck supported
- New measurement- lug diameter for trigger bottles
- Simple software that minimizes training
- Minimal maintenance for operation
- Simple software user interface for operators
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Color Recognition Imaging System
- No operator training
- Check colors anywhere
- Get same measurements with multiple systems
- Color classification at pixel level
- Customized measurements based on color classification
- Samples up to 200 mm x 200mm
- Integrated touchscreen
- Historical record keeping
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Display Inspection Vision System
- Suitable for displays between 10.1″ and 22″
- Provides high-quality illumination
- Cleans UUT for accurate inspection
- Identifies defects based on criteria
- Easy to operate
- Generates comprehensive reports
- Ensures reliable results
- Provides guidelines for upkeep
- Compatible with other quality control systems
- Can be tailored to specific needs
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FCA-02
- Adapter for F-Mount Lens To C-Mount Camera
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GTK-KIT-VS-14ST
- Machine Vision Training Kit, includes
- Lighting
- Optics
- Camera
- Mounting Hardware and Accessories
- for use with NI 910543-XX
- Machine Vision Training Kit, includes
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Monolith Open Area Testing System
- Designed for Monolith Inspection
- 8.3 µm/px resolution
- 12″ x 10.5″ Inspection area
- 1.5 – 6 min Inspection time
- High-resolution imaging in a single pass
- No manual repositioning of monoliths required
- < 2 seconds image processing time per monolith
- Intuitive, Touchscreen User Interface
- Seamless Data Logging and Historical Review
- Tested and validated for coated and uncoated monoliths
- Fully customizable to meet specific inspection requirements
View Product -
Residue Detection System
- Covered under our Patent US20140263981A1, whose advanced lighting technology improves contrast for detecting metal particles on patterned surfaces
- 200mm Wafer Inspection
- ≥ 5 mm Defect Detection
- Up to 300 Wafers inspected per hour
- 99.9% inspection in one shot
- No movement of the wafer required
- <1 second processing time
- User-Friendly Interface
- Seamless Integration with QC Systems
- Tested and validated for Copper and Tungsten
- Customizable Configuration
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System Design Review
- Have you made the right decisions?
- Request a vision system design review.
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System Design Service
- Creating Your Vision Together!
- Get Expert Assistance With
- Lighting
- Lens Filters
- Optics
- Cameras
- Software
- Mounting Hardware and Accessories