Semiconductor Wafer Inspection

Optical and Software Innovation for Yield Improvement

  • Manual inspection replaced by fully automated in lines inspection.
  • Patented lighting and pinhole lens enable the system to acquire optimal images for detection of process defects.

  • Return-of-investment in less than 6 months.
  • Scrap reduction.
  • Process improvements and 100% inspection resulting in continuous savings.

  • High MTBF.
  • Decade of performance.
  • Planned upgrades to address obsolescence.
  • Graftek provides technology that lasts.

Learn more about this success story.