Graftek Turnkey Systems

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Model	Description
Monolith Open Area Testing System	High-precision imaging system designed to inspect and analyze monoliths used in various industrial applications.
Residue Detection System	Advanced, high-throughput automated inspection platform designed to detect residual metal and other defects on semiconductor wafers during the Chemical Mechanical Planarization (CMP) process.
Display Inspection Vision System	Comprehensive machine vision system designed for inspecting the quality of various display components, including full assembly displays, bezels, and lenses.
Color Recognition Imaging System	Digital color assessment system that provides pixel-level color classification.
Bottle Inspection System	Gauge built to Industrial Equipment Specifications to measure the finish dimensions of HDPE bottles including T, E, H, S, N, height and Finish Flatness.